Electronics

3D inspection facilitating enhanced assurance of component authenticity.

In-house inspection* enabling accelerated testing to reduce stockholding period, and reduce working capital and exposure to price volatility risk.

* Adaptix offers a 3D image in 60 seconds, compared to sending your parts away for an X-ray report from a test house with typical lead times of 6 weeks.

THE INSPECTION GAME-CHANGER

Portable, benchtop unit allows on-site inspection to reduce component handling and transit, allowing faster stock-turns to reduce working capital and stock-holding risk, and increase the throughput capacity for a test, storage or warehouse facility.

In-house testing allows:

Faster inventory turns

• The compression of the inspection cycle from 6 weeks to 60 seconds
• Lower inventory holding periods due to not needing to wait for test results
• Faster time to cash receipt from customers

Enhanced risk management

• Reduced risk from price fluctuations on price-volatile components
• Reduced economic exposure when placing components into long-term storage

Reduced cost

• Reduced external test costs
• Reduced handling, transit and administration costs
• Removes capital cost of test equipment purchases

Improved efficiency

• More productive use of in-demand skilled inspectors to improve efficiency and effectiveness

Increased confidence

• Potential to increase sample size with same resource or give equal assurance at lower cost
• Better data to refute false return claims

– Transformed location: Inspection on your benchtop
– Workflow acceleration: A 6 week** inspection cycle in 60 seconds. No sending components to a test house
– Enhanced economics: AdaptixNDE charges a fee-per-scan to remove capital purchase costs and eliminates no-value activities
– Extended coverage: ‘Whole box’ inspection of components assists focusing sample selection

**Typical lead time when components are sent to a test house

AdaptixNDE: in-house, portable, 3D inspection:

A unique capability to test for coplanarity and immediately test for deformities, such as:
– Twisted chips or bent pins
– Uneven BGAs
– Missing or variants in dye;
– Broken wires

The war against counterfeit will never be won, but AdaptixNDE aims to let manufacturers and brokers defend themselves with a pipeline of further innovations including:

– automated non-uniform balls in BGA/bent or non-uniform pins
– automated quantification
– automated comparison with external data sets
– multi-modal and multi-spectral inspection
– oxidation detection
– comparison with large data sets of known-good and know-bad